Quality Knowledge Centre
AQL Inspection
Acceptance Quality Limit sampling for finished-garment inspection — sampling plans, sample selection, defect classification and lot disposition.
By Sanjeewa Dehiwalage · Reviewed
Scope
- Finished-garment (pre-shipment) and in-line audits.
- Attribute inspection using ISO 2859-1 / ANSI/ASQ Z1.4 single-sampling plans.
- Cartons drawn using ISO 2859-1 general inspection level II unless otherwise agreed.
- Critical, major and minor defect classification aligned to the buyer's approved defect list.
Cost & implementation difficulty
Not yet verified. Independently verified evidence is not available on this site. This section will be published only when a public reference exists.
Steps
- Agree AQL levels per defect class with the customer BEFORE lot presentation (e.g. 0/2.5/4.0).
- Determine lot size from packed cartons; select sample size using ISO 2859-1 Table 1 and 2A.
- Randomise carton selection using √N + 1 for carton-draw and pull garments by random sampling within.
- Inspect against the approved specification sheet, colour standard and workmanship standard.
- Record every defect against a coded checklist; distinguish critical / major / minor.
- Compare accumulated defects to accept/reject numbers; issue a written disposition.
Risks
- Using inspection level or AQL that does not match the buyer's approved plan.
- Sampling from a single carton or the top layer only — non-random draw.
- Classifying critical defects as major to keep the lot within Ac.
- Re-inspecting rejected lots without a documented rework and re-presentation step.
Evidence & records
- Signed AQL inspection report with lot size, sample size, plan and Ac/Re numbers.
- Coded defect log tied to the buyer's defect classification list.
- Photographic evidence for each critical / major defect found.
- Traceability to production batch, sewing line and inspector ID.
Case study
Not yet verified. Independently verified evidence is not available on this site. This section will be published only when a public reference exists.
Author & last reviewed
Authored by Sanjeewa Dehiwalage.
Last reviewed: